In this paper, the accelerated aging tests at several higher temperatures are carried out for a kind of RDX compound explosive charge used in a certain missile warhead. By statistical analysis of the test data, the shelf life distribution rule is studied, an estimate model for the shelf life is established, and the average value and the low confidence limits of the shelf life at storage temperature is predicted. Based on these the following conclusions are drawn: the shelf life of the warhead charge obeys lognormal distribution. At temperature 250C, its mean shelf life is 67.2 years, and the low confidence limit is 29.58, 23.06, 15.75 and 7.14 years at the confidence level 0.8, o.85, 0.9 and 0.95, respectively. The achievements obtained in this paper are of important value.