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基于加速退化数据的某导电膜电阻贮存寿命预测方法
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TB114.3

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A Prediction Method for Storage Life of Conducting Film Resistor Based on Accelerated Degradation Data
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    摘要:

    提出了一种基于加速退化数据的某导电膜电阻贮存寿命预测方法。首先对该导电膜电阻采用温度应力进行加速性能退化试验,试验中将该导电膜电阻的总阻值作为反映其性能的指标判据,在不同加速应力水平下得到在线测试和离线测试获取的加速性能退化数据;然后通过引入温度因数去除在线测试数据的温漂效应,再融合在线数据和离线数据进行退化轨迹模型参数辨识,获得该导电膜电阻在各加速应力水平下的伪寿命;然后结合经过修正的三参数温度加速模型评估得到该导电膜电阻在正常应力下的贮存寿命。最终以某导电膜电阻为例验证了所提方法的适用性和有效性。

    Abstract:

    A Prediction method for storage life of conducting film resistor based on accelerated degradation data is proposed in this paper. First of all, the accelerated performance degradation test of the conducting film resistor is carried out by using the temperature stress. In the experiment, the total resistance of the conductive film is used as a criterion of the performance, and the accelerated performance degradation data tested by online and offline testing are obtained under conditions of different accelerated stress; Secondly, the temperature drift effect of the online data is removed by introducing the temperature factor, and the online data is fused with the offline data to identify the degenerate trajectory parameters, and the pseudo life of the conducting film resistor at each acceleration stress level is obtained; Then, the storage life of the conducting film resistor under normal stress is obtained by combining the modified three parameter temperature acceleration model; Finally, taking a conducting film resistor as an example, the applicability and effectiveness of the proposed method are verified.

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陈志军,周芳,杨学印,王薇,胡彦平,张涛.基于加速退化数据的某导电膜电阻贮存寿命预测方法[J].空军工程大学学报,2019,20(4):46-51

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  • 在线发布日期: 2019-10-23
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